More like 'disabled by scoring a large 'X' with a laser across the die for those... | Hacker News

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		jacquesm on Dec 24, 2014 \| parent \| context \| favorite \| on: Intel’s e-DRAM Shows Up in the Wild More like 'disabled by scoring a large 'X' with a laser across the die for those features that are to be disabled'.

rbanffy on Dec 25, 2014 [–]

Yes, but only for those chips who would be binned in the high-end and go unsold.

And you can just design a couple on-chip fuses that can be broken in early stage testing. No need for lasers.

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